Stitching Interference (SSI) Measurement Device
A stitching interferometer for measuring aspheres with high precision and speed without using null optical systems.
Using a sub-aperture, the surface of the test object is measured under optimal conditions for each part, and the measurement results of each part are combined to calculate the overall surface shape of the test object. Compared to conventional Fizeau interferometers, it becomes possible to measure a wider range of shapes with higher precision. [Product Lineup] 1. ASI(Q) - Can measure flat, spherical, and aspherical shapes up to 300mm in diameter. (Support for larger diameters is also possible) - Can measure a 90° slope (a completely hemispherical surface). - Capable of measuring aspheres with 1000λ. - Achieves high measurement accuracy and high lateral resolution. 2. QIS Interferometer - High slope measurement capability, providing fast and high precision results. - Can measure small radius test surfaces with a wide focus range. - Dramatically improves spot measurement capability in MRF.
- Company：QED Technologies International, Inc.
- Price：Other
